Microscope testing machine

MTI Instruments Inc.recently acquired the Fullam line of miniature tensile-, compression- and bend-testing machines, which are specifically designed to fit inside scanning electron microscopes (SEMs), atomic force microscopes (AFMs) and light microscopes (LMs). MTII reports that the device’s dual leadscrew design symmetrically loads samples while keeping them centered within the scope’s field of view.

One hundred- and 1,000-pound versions are standard with a wide range of sample clamps, bending fixtures (three and four point) and compression anvils. Custom mounting adapters are available for integration into virtually all major microscopy tools. Optional heaters and thermoelectric heaters/coolers are also offered for testing under low- and high-temperature conditions.

Designed to perform fatigue, compression, bending and tensile testing, they are ideal for researchers and material scientists, according to MTII. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope. This provides greater insight into early stages of material failure and a better overall understanding of how specific materials perform.

To control experiments and collect data, the MTII/Fullam unit relies on a proprietary Windows®-based control and material testing software system that complies with ASTM specifications. This powerful package provides a user-friendly interface to set system test parameters and analyze data. Specimen dimensions are defined along with strain rates and thresholds (load, elongation, time), which are then used to perform automated tests and calculations. These parameters are stored as “recipes” that can be called upon again for future experiments. Results are provided in real time and stress-strain curves generated while testing is in progress. Key parameters such as peak load/stress, offset yield, modulus of elasticity and other measurements are reported. Raw test data and results can be exported in standard formats, making it easy to integrate with other data analysis and laboratory management systems.

The MTII/Fullam testing machine for SEMs, AFMs and light microscopes.